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    Please use this identifier to cite or link to this item: http://ir.nknu.edu.tw/ir/handle/987654321/22095

    題名: Degeneration of CMOS Power Cells after Hot-Carrier and Load Mismatch Stresses
    Authors: Ruey-Lue Wang;Chien-Hsuan Liu;Ruey-Lue Wang;Yan-Kuin Su;Chih-Ho Tu;Ying-Zong Juang
    Date: 2008
    Issue Date: 2014-11-14 18:05:30 (UTC+8)
    關聯: Electron Device Lett., vol.29, Sept. pp.1068-1070, 2008. (SCI)
    Appears in Collections:[電子工程學系] 期刊論文
    [電子系] 王瑞祿

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