English  |  正體中文  |  简体中文  |  Items with full text/Total items : 16335/24215 (67%)
Visitors : 13388927      Online Users : 693
RC Version 7.0 © Powered By DSPACE, MIT. Enhanced by NTU Library IR team.
Scope Tips:
  • please add "double quotation mark" for query phrases to get precise results
  • please goto advance search for comprehansive author search
  • Adv. Search
    HomeLoginUploadHelpAboutAdminister Goto mobile version
    Please use this identifier to cite or link to this item: http://ir.nknu.edu.tw/ir/handle/987654321/22091

    題名: DC and RF Degradation Induced by High RF Power Stresses in 0.18μm nMOSFETs
    Authors: Ruey-Lue Wang;Chien-Hsuan Liu;Yan-Kuin Su;Chih-Ho Tu;Ying-Zong Juang
    Date: 2010
    Issue Date: 2014-11-14 18:05:25 (UTC+8)
    關聯: has been accepted by IEEE Transactions on Device and Materials Reliability, Vol.10, Issue 3, pp.317-323, 2010.(SCI)
    Appears in Collections:[電子工程學系] 期刊論文
    [電子系] 王瑞祿

    Files in This Item:

    File SizeFormat

    All items in NKNUIR are protected by copyright, with all rights reserved.

    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library IR team Copyright ©   - Feedback