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    Please use this identifier to cite or link to this item: http://ir.nknu.edu.tw/ir/handle/987654321/22087


    Title: The Nanocrystalline Silicon Thickness Dependence of Transmission Characteristics of Coplanar Waveguides on Surface-Passivated High-resistivity Silicon Substrates
    Authors: Ruey-Lue Wang;Yan-Kuin Su;Chao-Jung Chen;Ting-Jen Hsueh
    王瑞祿
    Date: 2011
    Issue Date: 2014-11-14 18:05:19 (UTC+8)
    Relation: Electronics Letters, vol.47, Issue 20, pp. 1133-1134, 2011.(SCI)
    Appears in Collections:[Department of electronic engineering] journal papers
    [Department of Electronic Engineering teacher works] Ruey-Lue Wang

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