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    Items for Author "Jenn-Gwo Hwu" 

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    Showing 7 items.

    Collection Date 題名 Authors Bitstream
    [電子工程學系] 會議論文 2000 Role of Interface Trap Generation in the Low-Voltage Tunneling Current ( LVTC ) Characteristics of Ultra-Thin Gate Oxide ( ~2nm ) under High Field Stress Chia-Hong Huang; Jenn-Gwo Hwu; 黃嘉宏
    [電子工程學系] 會議論文 1999 The Breakdown Properties of Front- and Back-side Post Oxidation Annealed( POA ) Ultrathin Gate Oxide ( <3nm ) under High Field Stress Chia-Hong Huang; Jenn-Gwo Hwu; 黃嘉宏
    [電子工程學系] 期刊論文 2005 The Effect of Photon Illumination in Rapid Thermal Processing on the Characteristics of MOS Structures with Ultra-thin Oxides Examined by Substrate Injection Chia-Hong Huang; Jenn-Gwo Hwu; 黃嘉宏
    [電子工程學系] 期刊論文 2002 Effect of Mechanical Stress on the Characteristics of Silicon Thermal Oxides Chia-Hong Huang; Jui-Yuan Yen; Jenn-Gwo Hwu; 黃嘉宏
    [電子工程學系] 期刊論文 2001 Breakdown Characteristics of Ultra-thin Gate Oxide ( < 4nm ) in MOS Structure Subjected Substrate Injection Chia-Hong Huang; Jenn-Gwo Hwu; 黃嘉宏
    [電子工程學系] 期刊論文 2001 Anomalous Low-Voltage Tunneling Current ( LVTC ) Characteristics of Ultra-Thin Gate Oxide ( ~2nm ) after High Field Stress Chia-Hong Huang; Jenn-Gwo Hwu; 黃嘉宏
    [電子工程學系] 期刊論文 2000 Enhancement in Soft Breakdown Occurrence on Ultra-thin Gate Oxides Caused by Photon Effect in Rapid Thermal Post Oxidation Annealing Chia-Hong Huang; Jenn-Gwo Hwu; 黃嘉宏

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