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    Please use this identifier to cite or link to this item: http://ir.nknu.edu.tw/ir/handle/987654321/7214


    題名: A Fault Tolerant Testable Module for Wafer Scale Integrated Systems,
    Authors: 楊中皇
    Magdy A. Bayoumi;Chung-Huang Yang
    貢獻者: 資訊教育研究所
    Date: 1987-05
    Issue Date: 2010-10-21 10:57:36 (UTC+8)
    關聯: IEEE Proc. CompEuro '87, Hamburg, West Germany, May 1987 / pp. 590-593
    Appears in Collections:[資訊教育研究所] 會議論文
    [資教所] 楊中皇

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